High Precision Accuracy with Proprietary Multi-Reflection Suppression® (MRS®) Sensor Technology

High-Precision 3D Sensing Technology Solutions for Inspection and Metrology

High Precision Accuracy with Proprietary Multi-Reflection Suppression® (MRS®) Sensor Technology

Nordson TEST & INSPECTION's 2D and 3D sensors are used in SMT, semiconductor and metrology markets to significantly improve yields and productivity.

Proprietary MRS® sensor technology, deemed best-in-class, enables metrology-grade accuracy by inhibiting optical measurement distortions and reflections. At the heart of the world’s cell phone manufacturing inspection systems and used in various applications where highly accurate inspection is critical.

NEW SQ7000™+ Multi-Function for 3D AOI, SPI & CMM

SQ7000+ Multi-Function System with Multi-Reflection Suppression® (MRS®) sensor technology provides the ultimate combination of high resolution, high accuracy and high speed for inspection and metrology. It remains the only system on the market capable of performing AOI, SPI and CMM in-line. The new, ultra-high resolution 5 micron MRS sensor incorporated into the SQ3000+ is specifically designed for advanced applications with the most demanding requirements.

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New NanoResolution Multi-Reflection Suppression® (MRS®) Sensor Technology

For wafer-level and advanced packaging inspection and measurement, Nordson's proprietary NanoResolution Multi-Reflection Suppression® (MRS®) sensor technology meticulously identifies and rejects multiple reflections caused by shiny components and mirror-like surfaces. Effective suppression of multiple reflections is critical for highly accurate measurements.

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